IP Library › Assignment 016069/0098
Patent Assignment
Reel/Frame 016069/0098

Change of Name

Recorded: 2004-12-13 Received: 2004-12-16 Pages: 8
Assignor
Assignee
RENESAS SEMICONDUCTOR ENGINEERING CORPORATION
1 MIZUHARA 4-CHOME, ITAMI-SHI, HYOGO 664-0005, JPX, JAPAN
Covered Properties (2)
Apparatus and Method for Testing Semiconductor Integrated Circuit
Application: 09/927,368 →
Tester for Semiconductor Integrated Circuits and Method for Testing Semiconductor Integrated Circuits
Application: 09/904,625 →