Assignment of Assignor's Interest

Recorded: 2005-01-03 Pages: 2

Assignors

TAKAHASHI, HIROYUKI

Executed: 2004-07-16

INABA, HIDEO

Executed: 2004-07-16

UCHIDA, SYOUZOU

Executed: 2004-07-16

Assignee

NEC ELECTRONICS CORPORATION

1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA 211-8668, JAPAN

Covered Property (1)

Semiconductor Storage Device, Test Method Therefor, and Test Circuit Therefor

Patent: 7,193,917 →

Application: 10/498,398 →

Publication: US 2005/0207252

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.