IP Library Assignment 016112/0623
Patent Assignment
Reel/Frame 016112/0623

Assignment of Assignor's Interest

Recorded: 2004-12-30 Pages: 3
Assignor
MIKAMI, TORU
Executed: 2004-12-01
Assignee
KABUSHIKI KAISHA TOSHIBA
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Method for Monitoring Film Thickness, a System for Monitoring Film Thickness, a Method for Manufacturing a Semiconductor Device, and a Program Product for Controlling Film Thickness Monitoring System
Patent: 7,348,192 →
Application: 10/933,441 →
Publication: US 2005/0095730
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Aug 24, 2017
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 043709/0035 →
Merger Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: K.K. PANGEA
Reel/Frame 055659/0471 →
Change of Name and Address Jan 22, 2021
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 055669/0001 →
Change of Name and Address Jan 22, 2021
From: K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 055669/0401 →