Patent Assignment
Reel/Frame 016264/0838
Assignment of Assignor's Interest
Recorded: 2005-02-09
Pages: 3
Assignors
SATO, YASUO
Executed: 2005-01-26
HAMADA, SHUJI
Executed: 2005-01-26
MAEDA, TOSHIYUKI
Executed: 2005-01-26
TAKATORI, ATSUO
Executed: 2005-01-26
NOZUYAMA, YASUYUKI
Executed: 2005-01-26
Assignee
SEMICONDUCTOR TECHNOLOGY ACADEMIC RESEARCH CENTER
17-2, SHIN-YOKOHAMA 3-CHOME, KOHOKU-KU, YOKOHAMA-SHI, KANAGAWA, JAPAN
Covered Property
(1)
Circuit quality evaluation method and apparatus, circuit quality evaluation program, and medium having the program recorded thereon
Application:
11/052,908 →
Publication:
US 2005/0182587
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.