Patent Assignment
Reel/Frame 016299/0017
Assignment of Assignor's Interest
Recorded: 2005-02-18
Pages: 3
Assignee
KABUSHIKI KAISHA TOSHIBA
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Semiconductor Integrated Circuit Detecting Glitch Noise and Test Method of the Same
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.