Assignment of Assignor's Interest

Recorded: 2005-03-03 Pages: 2

Assignors

KONO, MOTOHIRO

Executed: 2005-01-27

NAKAZAWA, YOSHIYUKI

Executed: 2005-01-27

KITAJIMA, TOSHIKAZU

Executed: 2005-01-27

Assignee

DAINIPPON SCREEN MFG. CO., LTD.

1-1 TENJINKITAMACHI, TERANOUCHI-AGARU 4-CHOME, HORIKAWA-DORI, KAMIKYO-KU, KYOTO, JAPAN

Covered Property (1)

Method and Apparatus for Measuring Thickness of Thin Film Formed on Substrate

Patent: 7,427,520 →

Application: 11/069,996 →

Publication: US 2005/0206911

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.