IP Library Assignment 016352/0381
Patent Assignment
Reel/Frame 016352/0381

Assignment of Assignor's Interest

Recorded: 2005-03-03 Pages: 2
Assignor
SHIRAMIZU, YOSHIMI
Executed: 2005-02-16
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property (1)
Method for Analyzing Metal Element on Surface of Wafer
Patent: 7,348,188 →
Application: 11/070,096 →
Publication: US 2005/0196881
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Nov 11, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025346/0859 →
Change of Address Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →