IP Library Assignment 016361/0045
Patent Assignment
Reel/Frame 016361/0045

Assignment of Assignor's Interest

Recorded: 2005-03-07 Pages: 2
Assignor
OZAWA, HIROTARO
Executed: 2005-01-24
Assignee
FUJITSU LIMITED
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA, 211-8588, JAPAN
Covered Property (1)
Semiconductor Device-Testing Apparatus
Patent: 7,526,690 →
Application: 11/072,237 →
Publication: US 2005/0166113
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Dec 11, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021977/0219 →
Change of Name Jul 22, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024982/0245 →
Assignment of Assignor's Interest Apr 27, 2015
From: FUJITSU SEMICONDUCTOR LIMITED
To: SOCIONEXT INC.
Reel/Frame 035508/0337 →