Patent Assignment
Reel/Frame 016362/0818
Assignment of Assignor's Interest
Recorded: 2005-03-08
Pages: 2
Assignor
MACHIMURA, HIROKI
Executed: 2005-02-14
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU KAWASAKI, KANAGAWA 211-8668, JAPAN
Covered Property
(1)
Semiconductor Circuit Apparatus and Scan Test Method for Semiconductor Circuit
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.