IP Library › Assignment 016625/0910
Patent Assignment
Reel/Frame 016625/0910

Assignment of Assignor's Interest

Recorded: 2005-08-09 Pages: 2
Assignor
HWU, JUSTIN JAI-JEN
Executed: 2005-06-08
Assignee
HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V.
LOCATELLIKADE 1, PARNASSUSTOREN, 1076 AZ AMSTERDAM, NETHERLANDS
Covered Property (1)
Method for Determining Material Interfacial and Metrology Information of a Sample Using Atomic Force Microscopy
Patent: 7,767,961 →
Application: 11/149,789 →
Publication: US 2006/0289749
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Oct 25, 2012
From: HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V.
To: HGST NETHERLANDS B.V.
Reel/Frame 029341/0777 →
Assignment of Assignor's Interest Dec 5, 2016
From: HGST NETHERLANDS B.V.
To: WESTERN DIGITAL TECHNOLOGIES, INC.
Reel/Frame 040819/0450 →
Security Interest Feb 6, 2020
From: WESTERN DIGITAL TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A., AS AGENT
Reel/Frame 052915/0566 →
Release of Security Interest at Reel 052915 Frame 0566 Feb 8, 2022
From: JPMORGAN CHASE BANK, N.A.
To: WESTERN DIGITAL TECHNOLOGIES, INC.
Reel/Frame 059127/0001 →