IP Library Assignment 016642/0061
Patent Assignment
Reel/Frame 016642/0061

Assignment of Assignor's Interest

Recorded: 2005-10-14 Pages: 2
Assignors
SCHNEIDER, PETER
Executed: 2005-08-26
CUTLER, DAWN C.
Executed: 2005-08-26
Assignee
INFINEON TECHNOLOGIES NORTH AMERICA CORP.
1730 NORTH FIRST STREET, SAN JOSE, CALIFORNIA, 95112
Covered Property (1)
Method and arrangment for testing a stacked die semiconductor device
Application: 11/218,636 →
Publication: US 2007/0051949
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Oct 27, 2005
From: INFINEON TECHNOLOGIES NORTH AMERICA CORP.
To: INFINEON TECHNOLOGIES AG
Reel/Frame 016692/0622 →