Patent Assignment
Reel/Frame 016657/0257
Assignment of Assignor's Interest
Recorded: 2005-06-03
Pages: 2
Assignor
KIM, KYUNG-HOON
Executed: 2005-04-11
Assignee
HYNIX SEMICONDUCTOR INC.
SAN 136-1, AMI-RI, BUBAL-EUB, ICHON-SHI, KYOUNGKI-DO 467-860, KOREA, REPUBLIC OF
Covered Property
(1)
On-Chip Self Test Circuit and Self Test Method for Signal Distortion