Patent Assignment
Reel/Frame 016786/0754
Assignment of Assignor's Interest
Recorded: 2005-07-19
Pages: 4
Assignors
ITO, HARUKI
Executed: 2005-07-04
MIZUNO, SHINJI
Executed: 2005-07-04
YAMAGUCHI, KOJI
Executed: 2005-07-05
Assignee
SEIKO EPSON CORPORATION
4-1 NISHI-SHINJUKU 2-CHOME, SHINJUKU-KU, TOKYO, 163-0811, JAPAN
Covered Property
(1)
Test Probe and Tester, Method for Manufacturing the Test Probe
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.