Patent Assignment
Reel/Frame 016848/0610
Assignment of Assignor's Interest
Recorded: 2005-12-05
Pages: 3
Assignors
TAKAHASHI, MASAO
Executed: 2005-10-04
NAKATA, YOSHIROU
Executed: 2005-10-04
MIMURA, TADAAKI
Executed: 2005-10-04
SAKASHITA, TOSHIHIKO
Executed: 2005-10-04
FUKUDA, TOSHIYUKI
Executed: 2005-10-04
Assignee
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
1006, OAZA KADOMA, KADOMA-SHI,, OSAKA, 571-8501, JAPAN
Covered Property
(1)
Semiconductor Wafer and Testing Method Therefor
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Feb 3, 2014
From: PANASONIC CORPORATION (FORMERLY MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.)
To: GODO KAISHA IP BRIDGE 1
Reel/Frame 032152/0514 →
Assignment of Assignor's Interest
Oct 6, 2014
From: GODO KAISHA IP BRIDGE 1
To: PANASONIC CORPORATION
Reel/Frame 033896/0723 →
Assignment of Assignor's Interest
May 27, 2020
From: PANASONIC CORPORATION
To: PANASONIC SEMICONDUCTOR SOLUTIONS CO., LTD.
Reel/Frame 052755/0917 →