Assignment of Assignor's Interest

Recorded: 2006-01-30 Pages: 5

Assignors

CHARLIN, LAURENT

Executed: 2006-01-27

ZHANG, LI

Executed: 2005-11-16

Assignee

SIEMENS CORPORATE RESEARCH, INC.

755 COLLEGE ROAD EAST, PRINCETON, NEW JERSEY, 08540

Covered Property (1)

System and method for characterizing 2-dimensional shapes by compactness measurements

Application: 11/252,034 →

Publication: US 2006/0110048

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.