IP Library › Assignment 017274/0652
Patent Assignment
Reel/Frame 017274/0652

Assignment of Assignor's Interest

Recorded: 2005-11-22 Pages: 2
Assignor
KAWAMATA, HIROSHI
Executed: 2005-10-26
Assignee
FUJITSU LIMITED
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA 211-8588, JAPAN
Covered Property (1)
Tag Testing Device, Tag Testing Method, and Tag Testing Program
Patent: 7,425,896 →
Application: 11/283,839 →
Publication: US 2006/0220858
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Record to Add the Name and Address of the Second Assignee on the Assignment Document Previously Recorded at Reel 017274 Frame 0652. the Correct Name and Address of the Second Assigneeis Fujitsu Frontech Limted 1778, Yanokuchi Inagi-Shi, Tokyo 206-8555 May 18, 2006
From: KAWAMATA, HIROSHI
To: FUJITSU LIMITED; FUJITSU FRONTECH LIMITED
Reel/Frame 017647/0103 →
Corrective Assignment to Correctthe Second Assignee's Name Previously Recorded on Reel 017647, Frame 0103 Jul 19, 2006
From: KAWAMATA, HIROSHI
To: FUJITSU LIMITED; FUJITSU FRONTECH LIMITED
Reel/Frame 017964/0901 →