Assignment of Assignor's Interest

Recorded: 2005-11-29 Received: 2005-12-02 Pages: 2

Assignor

IC MEMS, INC.

Executed: 2005-11-07

Assignee

UNITEST INC.

#352-9, GOMAE-RI GIHEUNG-EUP, YONGIN-CITY, 449-901 KYUNGGI-DO, KRX, KOREA, REPUBLIC OF

Covered Properties (2)

Probe Structure for Testing Semiconductor Devices and Method for Fabricating the Same

Application: 10/125,248 →

Lighter with a Flipper Safety Mechanism

Application: 10/060,177 →