IP Library › Assignment 017334/0305
Patent Assignment
Reel/Frame 017334/0305

Assignment of Assignor's Interest

Recorded: 2005-12-06 Pages: 3
Assignors
RILEY, MACK WAYNE
Executed: 2005-12-05
CHELSTROM, NATHAN PAUL
Executed: 2005-12-05
Assignee
Covered Property (1)
Systems and Methods for Lbist Testing Using Isolatable Scan Chains
Patent: 7,484,153 →
Application: 11/295,057 →
Publication: US 2007/0130489
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Dec 6, 2005
From: KIRYU, NAOKI
To: TOSHIBA AMERICA ELECTRONIC COMPONENTS
Reel/Frame 017334/0243 →
Assignment of Assignor's Interest Jun 25, 2008
From: TOSHIBA AMERICA ELECTRONIC COMPONENTS, INC.
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 021152/0377 →
Assignment of Assignor's Interest Feb 22, 2018
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
Reel/Frame 045007/0891 →