Patent Assignment
Reel/Frame 017387/0460
Assignment of Assignor's Interest
Recorded: 2005-12-23
Received: 2005-12-28
Pages: 2
Assignor
HARTMANN, UDO
Executed: 2002-03-06
Assignee
INFINEON TECHNOLOGIES AG
ST.-MARTIN-STRASSE 53, MUENCHEN, DEX, D-81669, GERMANY
Covered Property
(1)
Test System for Conducting a Function Test of a Semiconductor Element on a Wafer, and Operating Method
Application:
10/076,977 →