IP Library Assignment 018017/0917
Patent Assignment
Reel/Frame 018017/0917

Assignment of Assignor's Interest

Recorded: 2006-07-26 Pages: 3
Assignors
BIDENBACH, REINER
Executed: 2006-07-11
SCHUBERT, JENS
Executed: 2006-07-07
KREDLER, STEFAN
Executed: 2006-07-10
JANKE, RALF
Executed: 2006-07-11
Assignee
MICRONAS GMBH
HANS-BUNTE-STRASSE 19, D-79108 FREIBURG, GERMANY
Covered Property (1)
Method and Apparatus for Testing a Hall Magnetic Field Sensor on a Wafer
Patent: 7,492,178 →
Application: 11/455,912 →
Publication: US 2006/0284612
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Mar 7, 2017
From: MICRONAS GMBH
To: TDK-MICRONAS GMBH
Reel/Frame 041901/0191 →