Patent Assignment
Reel/Frame 018112/0344
Assignment of Assignor's Interest
Recorded: 2006-07-17
Pages: 3
Assignors
SUTO, HIROYUKI
Executed: 2006-06-13
KANEGAE, MASAHIDE
Executed: 2006-06-13
KAWASHIMA, OSAMU
Executed: 2006-06-13
UMEDA, MICHIHIKO
Executed: 2006-06-13
Assignee
FUJITSU LIMITED
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA 211-8588, JAPAN
Covered Property
(1)
Method of Test of Clock Generation Circuit in Electronic Device, and Electronic Device
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.