Patent Assignment
Reel/Frame 018346/0170
Assignment of Assignor's Interest
Recorded: 2006-10-04
Pages: 7
Assignors
LALONDE, ANDRE RICHARD
Executed: 2006-09-05
SPEER, R. STEPHEN
Executed: 2006-08-23
GUENTER, JAMES KENNETH
Executed: 2006-08-23
Assignee
FINISAR CORPORATION
1389 MOFFETT PARK DRIVE, SUNNYVALE, CALIFORNIA, 94089
Covered Property
(1)
Methods and Apparatus for Device Testing at the Wafer Level
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.