Patent Assignment
Reel/Frame 018560/0309
Change of Name
Recorded: 2006-11-21
Pages: 38
Assignor
HITACHI HIGH-TECH ELECTRONICS ENGINEERING CO., LTD.
Executed: 2001-10-01
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Method and Apparatus for Testing a Memory Device in Quasi-Operating Conditions
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.