Patent Assignment
Reel/Frame 018651/0311
Assignment of Assignor's Interest
Recorded: 2006-11-28
Pages: 3
Assignor
HATAI, TETSUYA
Executed: 2006-10-12
Assignee
SHARP KABUSHIKI KAISHA
22-22 NAGAIKE-CHO, ABENO-KU, OSAKA-SHI, OSAKA, 545-8522, JAPAN
Covered Property
(1)
Exposure Operation Evaluation Method for Exposure Apparatus and Manufacturing Method for Semiconductor Device
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.