Assignment of Assignor's Interest

Recorded: 2006-12-18 Received: 2006-12-22 Pages: 2

Assignor

KOIZUMI, RYOJI

Executed: 2006-10-30

Assignee

FUJITSU LIMITED

1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA 211-8588, JPX, JAPAN

Covered Properties (2)

Semiconductor Device Verification System and Semiconductor Device Fabrication Method

Application: 11/640,231 →

System, method and apparatus for coordination of channel quality assessment and ingress filtering in cable modem systems

Application: 10/138,709 →