IP Library › Assignment 018806/0796
Patent Assignment
Reel/Frame 018806/0796

Corrective Assignment to Correct the Conveying Party and Receiving Party Data Previously Recorded on Reel 018700 Frame 0058. Assignor(S) Hereby Confirms the Conveyance of a Security Agreement to Imago Scientific Instruments Corporation.

Recorded: 2007-01-26 Received: 2007-01-26 Pages: 18
Assignor
Assignees
DRAPER ASSOCIATES, L.P.
2882 SAND HILL ROAD, SUITE 150, MENLO PARK, CA, 94025, UNITED STATES
DRAPER FISHER JURVETSON FUND VII, L.P.
2882 SAND HILL ROAD, SUITE 150, MENLO PARK, CA, 94025, UNITED STATES
DRAPER FISHER JURVETSON PARTNERS VII, LLC
2882 SAND HILL ROAD, SUITE 150, MENLO PARK, CA, 94025, UNITED STATES
PORTAGE VENTURE FUND, LP
ONE NORTHFIELD PLAZA, SUITE 530, NORTHFIELD, IL, 60093, UNITED STATES
PORTAGE FOUNDERS, LP
ONE NORTHFIELD PLAZA, SUITE 530, NORTHFIELD, IL, 60093, UNITED STATES
DFJ PORTAGE VENTURE FUND I
ONE NORTHFIELD PLAZA, SUITE 530, NORTHFIELD, IL, 60093, UNITED STATES
CIPIO PARTNERS FUND III GMBH & CO. KG
PALAIS AM LENBACHPLATZ, OTTOSTRASSE 8, MUNICH, DEX, D-80333, GERMANY
Covered Properties (24)
Atom Probe Pulse Energy
Atom Probes, Atom Probe Specimens, and Associated Methods
Atom Probe Evaporation Processes
Specimens for Microanalysis Processes
Atom Probe Component Treatments
Short duration variable amplitude high voltage pulse generator
Application: 10/575,812 →
Imaging, visualizing, and/or analyzing atomic structures
Application: 60/791,237 →
Atom probe systems and processes
Application: 60/786,317 →
Atom probes and atom probe data
Application: 60/786,295 →
Atom probe measurements, including those related to surface roughness
Application: 60/786,148 →
Atom probe calibration and related structures and methods
Application: 60/753,929 →
Laser Atom Probes
High Resolution Atom Probe
Application: 10/559,733 →
Method to Form Microtips
Atom Probe Electrode Treatments
Methods and Devices for Atom Probe Mass Resolution Enhancement
Laser Atom Probe Methods
Laser Atom Probe
Method to Determine 3-D Elemental Composition and Structure of Biological and Organic Materials via Atom Probe Microscopy
Methods of Sampling Specimens for Microanalysis
Application: 10/428,372 →
Vacuum Chamber with Recessed Viewing Tube and Imaging Device Situated Therein
Application: 10/419,035 →
Delay Line Anodes
Application: 09/888,940 →
Methods of Sampling Specimens for Microanalysis
Application: 09/861,405 →
Device and Method for Two-Dimensional Detection of Particles or Electromagnetic Radiation
Application: 09/782,003 →