Patent Assignment
Reel/Frame 019168/0459
Assignment of Assignor's Interest
Recorded: 2007-04-02
Pages: 4
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property
(1)
Semiconductor Integrated Circuit Device, Measurement Method Therefore and Measurement System for Measuring Ac Characteristics Thereof
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.