IP Library Assignment 019338/0495
Patent Assignment
Reel/Frame 019338/0495

Assignment of Assignor's Interest

Recorded: 2007-05-07 Pages: 3
Assignors
IKEJIRI, HIDEO
Executed: 2007-04-27
ONISHI, SHINSUKE
Executed: 2007-04-27
Assignee
OKI ELECTRIC INDUSTRY CO., LTD.
7-12, TORANOMON 1-CHOME, MINATO-KU, TOKYO, 105-8460, JAPAN
Covered Property (1)
Semiconductor Device with Its Test Time Reduced and a Test Method Therefor
Patent: 7,564,265 →
Application: 11/797,698 →
Publication: US 2008/0071486
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jan 22, 2009
From: OKI ELECTRIC INDUSTRY CO., LTD.
To: OKI SEMICONDUCTOR CO., LTD.
Reel/Frame 022162/0669 →
Change of Name Mar 21, 2014
From: OKI SEMICONDUCTOR CO., LTD
To: LAPIS SEMICONDUCTOR CO., LTD.
Reel/Frame 032495/0483 →