Patent Assignment
Reel/Frame 019385/0302
Assignment of Assignor's Interest
Recorded: 2007-05-22
Pages: 3
Assignee
SHARP KABUSHIKI KAISHA
22-22 NAGAIKE-CHO ABENO-KU, OSAKA-SHI, OSAKA, 545-8522, JAPAN
Covered Property
(1)
Semiconductor Device, Semiconductor Device Testing Method, and Probe Card
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.