Patent Assignment
Reel/Frame 019407/0939
Assignment of Assignor's Interest
Recorded: 2007-06-11
Received: 2007-06-11
Pages: 5
Assignors
NANOMETRIC INCORPORATED
Executed: 2007-05-31
NANOMETRICS IVS DIVISION, INC. (F/K/A SOLURIS INC.)
Executed: 2007-05-31
Assignee
SNU PRECISION CO., LTD.
#201 DONG-A TOWN, 1629-2, BONGCHUN 7-DONG, SEOUL, KWANAK-KU, SOUTH, KRX, 151-818, KOREA, REPUBLIC OF
Covered Properties
(11)
Buried-Gated Photodiode Device and Method for Configuring and Operating Same
Application:
11/412,280 →
Apparatus and Method for Image Optimization of Samples in a Scanning Electron Microscope
Application:
10/985,144 →
Decompression Unit for Equalizing an Explosive Air Pressure
Application:
10/311,608 →
Fixture for Microscope Component Alignment
Application:
10/163,917 →
Beam Alignment in a Lower Column of a Scanning Electron Microscope or the Like
Application:
10/136,692 →
Reduction of Aberrations Produced by Wien Filter in a Scanning Electron Microscope and the Like
Application:
09/994,563 →
Wien Filter for Use in a Scanning Electron Microscope or the Like
Application:
10/010,321 →
Fixture for Assembling Parts of a Device Such as a Wien Filter
Application:
10/011,007 →
Vibration-Isolating Coupling Including an Elastomer Diaphragm for Scanning Electron Microscope and the Like
Application:
10/007,484 →
System and method for inhibiting motion of semiconductor wafers in a variable-pressure chamber
Application:
10/007,618 →
Removing Noise Caused by Artifacts from a Digital Image Signal
Application:
09/957,870 →