Patent Assignment
Reel/Frame 019438/0710
Assignment of Assignor's Interest
Recorded: 2007-06-08
Pages: 5
Assignor
SANADA, KENICHI
Executed: 2007-04-16
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property
(1)
Method for Preparing Focus-Adjustment Data for Focusing Lens System of Optical Defect-Inspection Apparatus, and Focus Adjustment Wafer Used in Such Method
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.