IP Library › Assignment 019667/0037
Patent Assignment
Reel/Frame 019667/0037

Assignment of Assignor's Interest

Recorded: 2007-08-08 Pages: 2
Assignors
TORISAKI, YUISHI
Executed: 2007-01-09
FUJIWARA, MAKOTO
Executed: 2007-01-09
NEMOTO, YUSUKE
Executed: 2007-01-09
Assignee
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
1006 OAZA KADOMA, KADOMA-SHI, OSAKA, 571-8501, JAPAN
Covered Property (1)
Semiconductor Integrated Circuit and Method for Testing Semiconductor Integrated Circuit
Patent: 7,913,316 →
Application: 11/703,719 →
Publication: US 2007/0234138
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Nov 21, 2008
From: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
To: PANASONIC CORPORATION
Reel/Frame 021897/0606 →
Assignment of Assignor's Interest May 27, 2020
From: PANASONIC CORPORATION
To: PANASONIC SEMICONDUCTOR SOLUTIONS CO., LTD.
Reel/Frame 052755/0917 →