Patent Assignment
Reel/Frame 019840/0233
Assignment of Assignor's Interest
Recorded: 2007-09-18
Pages: 5
Assignors
LEE, HONG WOO
Executed: 2007-09-13
HUR, MYUNG KOO
Executed: 2007-09-13
LEE, JONG HWAN
Executed: 2007-09-13
KIM, SUNG MAN
Executed: 2007-09-13
LEE, JONG HYUK
Executed: 2007-09-13
Assignee
SAMSUNG ELECTRONICS CO., LTD.
416, MAETAN-DONG, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF
Covered Property
(1)
Module and Method for Detecting Defect of Thin Film Transistor Substrate
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.