IP Library › Assignment 019972/0501
Patent Assignment
Reel/Frame 019972/0501

Assignment of Assignor's Interest

Recorded: 2007-10-16 Pages: 2
Assignors
LORUSSO, GIAN FRANCESCO
Executed: 2007-10-11
JONCKHEERE, RIK
Executed: 2007-10-11
GOETHALS, ANNE-MARIE
Executed: 2007-10-11
HERMANS, JAN
Executed: 2007-10-11
Assignee
INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM VZW (IMEC)
KAPELDREEF 75, LEUVEN, 3001, BELGIUM
Covered Property (1)
Method and System for Measuring Contamination of a Lithographical Element
Patent: 7,750,319 →
Application: 11/846,306 →
Publication: US 2008/0315125
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
"Imec" Is an Alternative Official Name for "Interuniversitair Microelektronica Centrum Vzw" Apr 7, 2010
From: INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM VZW
To: IMEC
Reel/Frame 024200/0675 →