IP Library Assignment 020028/0961
Patent Assignment
Reel/Frame 020028/0961

Assignment of Assignor's Interest

Recorded: 2007-10-29 Pages: 2
Assignors
MIYAKE, NAOMI
Executed: 2007-03-28
NAKATA, YOSHIRO
Executed: 2007-03-28
Assignee
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
1006 OAZA KADOMA, KADOMA-SHI, OSAKA, 571-8501, JAPAN
Covered Property (1)
Inspection Apparatus and Method for Semiconductor Ic
Patent: 7,589,546 →
Application: 11/806,766 →
Publication: US 2007/0278662
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Nov 20, 2008
From: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
To: PANASONIC CORPORATION
Reel/Frame 021897/0534 →