Patent Assignment
Reel/Frame 020348/0644
Assignment of Assignor's Interest
Recorded: 2008-01-10
Pages: 2
Assignors
NAKASE, MASAYUKI
Executed: 2007-06-21
AKAHORI, KOUJI
Executed: 2007-06-21
KANEMITSU, TOMOHIKO
Executed: 2007-06-21
KAMATANI, YASUHIRO
Executed: 2007-06-21
Assignee
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
1006 OAZA KADOMA, KADOMA-SHI, OSAKA, 571-8501, JAPAN
Covered Property
(1)
Handler and method of testing semiconductor device by means of the handler
Application:
11/822,219 →
Publication:
US 2008/0007285
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.