Patent Assignment
Reel/Frame 020395/0743
Assignment of Assignor's Interest
Recorded: 2008-01-22
Pages: 2
Assignors
HONG, YING
Executed: 2007-12-20
JAYASEKARA, WIPUL P.
Executed: 2007-12-20
MAURI, DANIELE
Executed: 2007-12-20
SEAGLE, DAVID J.
Executed: 2007-12-20
Assignee
HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V.
LOCATELLIKADE 1, PARNASSUSTOREN, AMSTERDAM, 1076 AZ, NETHERLANDS
Covered Property
(1)
Test Device and Method for Measurement of Tunneling Magnetoresistance Properties of a Manufacturable Wafer by the Current-in-Plane-Tunneling Technique
Related Assignments
(4)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name
Oct 25, 2012
From: HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V.
To: HGST NETHERLANDS B.V.
Reel/Frame 029341/0777 →
Assignment of Assignor's Interest
Dec 6, 2016
From: HGST NETHERLANDS B.V.
To: WESTERN DIGITAL TECHNOLOGIES, INC.
Reel/Frame 040826/0821 →
Security Interest
Feb 6, 2020
From: WESTERN DIGITAL TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A., AS AGENT
Reel/Frame 052915/0566 →
Release of Security Interest at Reel 052915 Frame 0566
Feb 8, 2022
From: JPMORGAN CHASE BANK, N.A.
To: WESTERN DIGITAL TECHNOLOGIES, INC.
Reel/Frame 059127/0001 →