Patent Assignment
Reel/Frame 020526/0155
Assignment of Assignor's Interest
Recorded: 2008-02-19
Pages: 2
Assignors
NAGAI, MASAAKI
Executed: 2007-07-10
TSUTSUMI, KENJI
Executed: 2007-07-10
NAKAZAWA, HIDESHI
Executed: 2007-07-10
Assignee
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
1006 OAZA KADOMA, KADOMA-SHI, OSAKA, 571-8501, JAPAN
Covered Property
(1)
Semiconductor integrated circuit including a malfunction detection circuit, and a design method for the same
Application:
11/878,520 →
Publication:
US 2008/0024173
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.