Patent Assignment
Reel/Frame 020766/0679
Assignment of Assignor's Interest
Recorded: 2008-04-07
Pages: 3
Assignor
NISHIYAMA, HIDETOSHI
Executed: 2008-02-12
Assignee
JEOL LTD.
1-2, MUSASHINO 3-CHOME, AKISHIMA, TOKYO, 196-8558, JAPAN
Covered Property
(1)
Sample Inspection Apparatus, Sample Inspection Method and Sample Inspection System