Patent Assignment
Reel/Frame 021089/0313
Assignment of Assignor's Interest
Recorded: 2008-06-12
Pages: 2
Assignors
WANG, JONG HYUN
Executed: 2008-05-15
JANG, CHAE KYU
Executed: 2008-05-15
PARK, SE CHUN
Executed: 2008-05-15
Assignee
HYNIX SEMICONDUCTOR INC.
SAN 136-1, AMI-RI, BUBAL-EUB, KYOUNGKI-DO, ICHEON-SI, KOREA, REPUBLIC OF
Covered Property
(1)
Methods for Performing Fail Test, Block Management, Erasing and Programming in a Nonvolatile Memory Device