Patent Assignment
Reel/Frame 021118/0130
Release of Security Interest
Recorded: 2008-06-19
Pages: 7
Assignor
SILICON VALLEY BANK
Executed: 2008-06-18
Assignee
PHOTON DYNAMICS INC.
6970 OPTICAL COURT, SAN JOSE, CALIFORNIA, 95138
Covered Properties
(19)
Voltage Imaging System Using Electro-Optics
Patent:
4,983,911 →
Application:
07/481,429 →
Method and Apparatus for Testing Lcd Panel Array
Patent:
5,285,150 →
Application:
07/618,183 →
Method and Apparatus for Testing Lcd Panel Array Prior to Shorting Bar Removal
Patent:
5,081,687 →
Application:
07/621,190 →
Voltage Imaging System Using Electro-Optics
Patent:
5,124,635 →
Application:
07/654,709 →
Method and Apparatus for Automatically Inspecting and Repairing an Active Matrix Lcd Panel
Patent:
5,235,272 →
Application:
07/716,592 →
Method of Testing Active Matrix Liquid Crystal Display Substrates
Patent:
5,432,461 →
Application:
07/722,963 →
Testing Apparatus for Liquid Crystal Display Substrates
Patent:
5,444,385 →
Application:
07/757,452 →
Electro-Optical Element and Its Manufacturing Method
Patent:
5,615,039 →
Application:
07/757,454 →
Testing Device for Liquid Crystal Display Base Plate
Patent:
5,459,409 →
Application:
07/757,458 →
Method of Testing Liquid Crystal Display Substrates
Patent:
5,465,052 →
Application:
07/757,460 →
A Testing Method for Imaging Defects in a Liquid Crystal Display Substrate
Patent:
5,504,438 →
Application:
07/757,467 →
Instrument for Testing Liquid Crystal Display Base Plates
Patent:
5,406,213 →
Application:
07/758,895 →
Method and Apparatus for Positioning and Biasing an Electro-Optic Modulator of an Electro-Optic Imaging System
Patent:
5,212,374 →
Application:
07/804,257 →
Method and Apparatus for Positioning and Biasing an Electro-Optic Modulator of an Electro-Optic Imaging System
Patent:
5,387,788 →
Application:
08/027,210 →
Method and Apparatus for Automatically Inspecting and Repairing an Active Matrix Lcd Panel
Patent:
5,459,410 →
Application:
08/046,546 →
Method and Apparatus for Testing Lcd Panel Array
Patent:
5,363,037 →
Application:
08/083,126 →
Method and Apparatus for Observing Defects on a Surface by Scattered Energy
Patent:
5,631,733 →
Application:
08/375,903 →
Flat Panel Display Inspection System
Patent:
5,764,209 →
Application:
08/394,668 →
Technique for Determining Defect Positions in Three Dimensions in a Transparent Structure
Patent:
5,790,247 →
Application:
08/721,332 →
Related Assignments
(2)
Other recorded transfers of the patents in this record — the chain of ownership.