Assignment of Assignor's Interest

Recorded: 2008-07-03 Pages: 2

Assignor

ITOH, MASAAKI

Executed: 2008-06-04

Assignee

SEIKO INSTRUMENTS INC.

8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN

Covered Property (1)

Ion Beam Inspection Apparatus, Ion Beam Inspecting Method, Semiconductor Manufacturing Apparatus, and Ion Source Apparatus

Patent: 7,807,985 →

Application: 12/080,999 →

Publication: US 2008/0265180

Related Assignments (2)

Other recorded transfers of the patent in this record — the chain of ownership.