Patent Assignment
Reel/Frame 021265/0473
Assignment of Assignor's Interest
Recorded: 2008-07-21
Received: 2008-07-21
Pages: 2
Assignor
KANEKO, MASAAKI
Executed: 2008-06-24
Assignee
TOSHIBA AMERICA ELECTRONIC COMPONENTS, INC.
KABUSHIKI KAISHA TOSHIBA, 1-1 SHIBAURA 1-CHOME, MINATO-KU, TOKYO, JPX, JAPAN
Covered Properties
(2)
Method and Apparatus for On-Chip Testing of High Speed Frequency Dividers
Application:
12/163,166 →
Light Fixtures and Lighting Devices
Application:
12/116,348 →