Patent Assignment
Reel/Frame 021315/0749
Assignment of Assignor's Interest
Recorded: 2008-07-24
Pages: 22
Assignors
BAUMANN, JOACHIM
Executed: 2008-06-25
DAVID, CHRISTIAN
Executed: 2008-07-01
ENGELHARDT, MARTIN
Executed: 2008-06-25
FREUDENBERGER, JORG
Executed: 2008-06-24
HEMPEL, ECKHARD
Executed: 2008-06-24
HOHEISEL, MARTIN
Executed: 2008-06-24
HONAL, MATTHIAS
Executed: 2008-06-25
MERTELMEIER, THOMAS
Executed: 2008-06-27
PFEIFFER, FRANZ
Executed: 2008-06-24
POPESCU, STEFAN
Executed: 2008-06-24
SCHUSTER, MANFRED
Executed: 2008-06-25
Assignee
SIEMENS AKTIENGESELLSCHAFT
WITTELSBACHERPLATZ 2, MUNICH, D-80333, GERMANY
Covered Property
(1)
Measurement System and Method for the Noninvasive Determination of Properties of an Object to Be Examined and Contrast Medium for X-Ray Phase-Contrast Measurement
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.