Assignment of Assignor's Interest

Recorded: 2008-08-22 Pages: 2

Assignor

HIROTA, AKIHIRO

Executed: 2008-08-14

Assignee

OKI ELECTRIC INDUSTRY CO., LTD.

7-12, TORANOMON, 1-CHOME, MINATO-KU, TOKYO, 105-8460, JAPAN

Covered Property (1)

Semiconductor Testing Apparatus and Method

Application: 12/196,420 →

Publication: US 2009/0089633

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.