IP Library › Assignment 021468/0315
Patent Assignment
Reel/Frame 021468/0315

Assignment of Assignor's Interest

Recorded: 2008-09-02 Pages: 2
Assignors
KISHIMOTO, SATOSHI
Executed: 2008-06-30
KANEMITSU, TOMOHIKO
Executed: 2008-06-30
Assignee
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
1006 OAZA KADOMA, KADOMA-SHI, OSAKA, 571-8501, JAPAN
Covered Property (1)
Semiconductor Testing Circuit and Semiconductor Testing Method
Patent: 7,733,112 →
Application: 12/173,860 →
Publication: US 2009/0021279
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Mar 6, 2009
From: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
To: PANASONIC CORPORATION
Reel/Frame 022363/0306 →
Assignment of Assignor's Interest Mar 25, 2015
From: PANASONIC CORPORATION
To: SOCIONEXT INC.
Reel/Frame 035294/0942 →