Patent Assignment
Reel/Frame 021498/0728
Assignment of Assignor's Interest
Recorded: 2008-09-09
Pages: 2
Assignee
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
1006 OAZA KADOMA, KADOMA-SHI, OSAKA, 571-8501, JAPAN
Covered Property
(1)
Semiconductor Device and Semiconductor Testing Method
Application:
12/160,590 →
Publication:
US 2010/0164535
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.