IP Library Assignment 021608/0370
Patent Assignment
Reel/Frame 021608/0370

Assignment of Assignor's Interest

Recorded: 2008-09-30 Pages: 5
Assignors
TERASAWA, TSUNEO
Executed: 2008-09-12
TANAKA, TOSHIHIKO
Executed: 2008-09-12
AOTA, TATSUYA
Executed: 2008-09-22
Assignee
RENESAS TECHNOLOGY CORP.
6-2, OTEMACHI 2-CHOME, CHIYODA-KU,, TOKYO, 100-0004, JAPAN
Covered Property (1)
Apparatus and a Method for Inspection of a Mask Blank, a Method for Manufacturing a Reflective Exposure Mask, a Method for Reflective Exposure, and a Method for Manufacturing Semiconductor Integrated Circuits
Patent: 7,911,600 →
Application: 12/241,614 →
Publication: US 2009/0091752
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 14, 2010
From: RENESAS TECHNOLOGY CORP.
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024982/0558 →
Change of Address Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →