Patent Assignment
Reel/Frame 021821/0292
Assignment of Assignor's Interest
Recorded: 2008-10-27
Pages: 3
Assignor
KOSHITA, GEN
Executed: 2008-10-24
Assignee
ELPIDA MEMORY, INC.
2-1, YAESU 2-CHOME, CHUO-KU, TOKYO, JAPAN
Covered Property
(1)
Semiconductor Memory Device and Method of Defective Cell Test by Adjusting a Bitline Reference/Precharge Level
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.