Assignment of Assignor's Interest

Recorded: 2008-11-25 Received: 2008-11-25 Pages: 3

Assignors

GLADNEY, RICK F.

Executed: 2001-07-13

ARROWOOD, JAMES MARTIN

Executed: 2001-07-16

Assignee

SIMMONS COMPANY

ONE CONCOURSE PARKWAY, SUITE 800, ATLANTA, GA, 30328, UNITED STATES

Covered Properties (5)

Semiconductor Substrate Processing Method and Apparatus

Application: 11/040,329 →

System and Method for Depth Profiling and Characterization of Thin Films

Application: 10/493,492 →

Nondestructive Characterization of Thin Films Based on Acquired Spectrum

Application: 10/330,317 →

Nondestructive Characterization of Thin Films Using Measured Basis Spectra

Application: 10/330,383 →

Method and System for Analyzing Motion Transferred to a Subject on a Sleeping Surface

Application: 09/898,747 →